APA Citation

He, L., & Rusli. (2009). Investigation of multilayer thin films using ellipsometry.

Chicago Style Citation

He, Lining., and Rusli. Investigation of Multilayer Thin Films Using Ellipsometry. 2009.

MLA Citation

He, Lining., and Rusli. Investigation of Multilayer Thin Films Using Ellipsometry. 2009.

Warning: These citations may not always be 100% accurate.