APA引文

He, L., & Rusli. (2009). Investigation of multilayer thin films using ellipsometry.

Chicago Style Citation

He, Lining., and Rusli. Investigation of Multilayer Thin Films Using Ellipsometry. 2009.

MLA引文

He, Lining., and Rusli. Investigation of Multilayer Thin Films Using Ellipsometry. 2009.

警告：這些引文格式不一定是100％准確.