Polarimetric imaging via deep learning: a review

• Main Authors: Li, Xiaobo, Yan, Lei, Qi, Pengfei, Zhang, Liping, François,Goudail, Liu, Tiegen, Zhai, Jingsheng, Hu, Haofeng.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2023
• Subjects: Engineering::Electrical and electronic engineering; Polarization; Polarimetric Imaging
• Online Access: https://hdl.handle.net/10356/169472
• Institution: Nanyang Technological University

Polarization can provide information largely uncorrelated with the spectrum and intensity. Therefore, polarimetric imaging (PI) techniques have significant advantages in many fields, e.g., ocean observation, remote sensing (RS), biomedical diagnosis, and autonomous vehicles. Recently, with the increasing amount of data and the rapid development of physical models, deep learning (DL) and its related technique have become an irreplaceable solution for solving various tasks and breaking the limitations of traditional methods. PI and DL have been combined successfully to provide brand-new solutions to many practical applications. This review briefly introduces PI and DL’s most relevant concepts and models. It then shows how DL has been applied for PI tasks, including image restoration, object detection, image fusion, scene classification, and resolution improvement. The review covers the state-of-the-art works combining PI with DL algorithms and recommends some potential future research directions. We hope that the present work will be helpful for researchers in the fields of both optical imaging and RS, and that it will stimulate more ideas in this exciting research field.