APA引文

Manikanthababu, N., Joishi, C., Biswas, J., Prajna, K., Asokan, K., Vas, J. V., . . . Engineering, S. o. M. S. a. (2023). Ion irradiation-induced interface mixing and the charge trap profiles investigated by in situ electrical measurements in Pt/Al₂O₃/β-Ga₂O₃MOSCAPs.

Chicago Style Citation

Manikanthababu, N., et al. Ion Irradiation-induced Interface Mixing and the Charge Trap Profiles Investigated By in Situ Electrical Measurements in Pt/Al₂O₃/β-Ga₂O₃MOSCAPs. 2023.

MLA引文

Manikanthababu, N., et al. Ion Irradiation-induced Interface Mixing and the Charge Trap Profiles Investigated By in Situ Electrical Measurements in Pt/Al₂O₃/β-Ga₂O₃MOSCAPs. 2023.