Diagnosis of doped conjugated polymer films using hyperspectral imaging
Absorption spectra of doped conjugated polymer films provide valuable information on the degree of crystallinity, doping efficiency, material composition, and film thickness. The absorption spectral features commonly observed in doped polymers are due to intra-, inter-chain excitons, exciton–phonon...
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| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2023
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/171079 |
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| Institution: | Nanyang Technological University |
| Language: | English |
| Summary: | Absorption spectra of doped conjugated polymer films provide valuable information on the degree of crystallinity, doping efficiency, material composition, and film thickness. The absorption spectral features commonly observed in doped polymers are due to intra-, inter-chain excitons, exciton–phonon coupling, polarons, and bipolarons that are branched differently in films prepared at different process parameters and doping conditions. Thus, the spectral features of thin films can be used to monitor and tune process parameters. However, probing spectral information at a point does not provide complete information on the solution-processed films where film characteristics are significantly influenced by uncontrolled process parameters. Hyperspectral imaging (HSI) is a high throughput spectral diagnostic method that provides the spatial distribution of spectral features where the process-induced variations of thin film quality and their influence on final performance metrics can be effectively analysed. In this report, we present a methodology for diagnosing thin film characteristics using the HSI technique by implementing automated spectral feature extraction and visualisation. For this study, we used the well-established F4TCNQ-doped regio regular poly-3-hexyl thiophene (P3HT) film as a model system and show film quality parameters, such as variation in film thickness, homogeneity of materials composition, degree of crystallinity and polaron concentration. We also present a generic process flow for the rapid screening of thin film and process optimization using the HSI technique. |
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