Critical metal identification from waste electronics

Due to the Surge increase in electronic products, electronic waste is dramatically increased annually. Wasted electronics can be an environmental hazard as there are numerous metals involved that are toxic to humans and the ecosystem. Researchers and industrial practitioners have tried to recover me...

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Main Author: Li, Wen Jie
Other Authors: Alex Yan Qingyu
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2023
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Online Access:https://hdl.handle.net/10356/171821
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1718212023-11-15T07:49:16Z Critical metal identification from waste electronics Li, Wen Jie Alex Yan Qingyu School of Materials Science and Engineering AlexYan@ntu.edu.sg Engineering::Materials Due to the Surge increase in electronic products, electronic waste is dramatically increased annually. Wasted electronics can be an environmental hazard as there are numerous metals involved that are toxic to humans and the ecosystem. Researchers and industrial practitioners have tried to recover metals from electronic waste; however, the process seems technically difficult. The barrier leading to the conventional recycling process being non-economic and non-technical feasible is attributed to the low content of rare critical metals and their high dispersion. In this research, various types of thick film resistors (TFRs) were disassembled from waste printed circuit boards (PCBs) and analyzed respectively. The targeting critical metal is Ruthenium (Ru). Multiple characterization methods, including Scanning Electron Microscope-Energy Dispersive X-ray Spectroscopy (SEM-EDX), Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES), and X-ray Fluorescence Spectroscopy (XRF), were involved in determining its qualitative and quantitative data. This research provides a view on Ru content and distribution in TFRs and overall PCBs. It supports the basis to further study the recycling methods of such critical metal from waste electronics. Bachelor of Engineering (Materials Engineering) 2023-11-09T02:46:33Z 2023-11-09T02:46:33Z 2023 Final Year Project (FYP) Li, W. J. (2023). Critical metal identification from waste electronics. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/171821 https://hdl.handle.net/10356/171821 en application/pdf Nanyang Technological University
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Materials
spellingShingle Engineering::Materials
Li, Wen Jie
Critical metal identification from waste electronics
description Due to the Surge increase in electronic products, electronic waste is dramatically increased annually. Wasted electronics can be an environmental hazard as there are numerous metals involved that are toxic to humans and the ecosystem. Researchers and industrial practitioners have tried to recover metals from electronic waste; however, the process seems technically difficult. The barrier leading to the conventional recycling process being non-economic and non-technical feasible is attributed to the low content of rare critical metals and their high dispersion. In this research, various types of thick film resistors (TFRs) were disassembled from waste printed circuit boards (PCBs) and analyzed respectively. The targeting critical metal is Ruthenium (Ru). Multiple characterization methods, including Scanning Electron Microscope-Energy Dispersive X-ray Spectroscopy (SEM-EDX), Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES), and X-ray Fluorescence Spectroscopy (XRF), were involved in determining its qualitative and quantitative data. This research provides a view on Ru content and distribution in TFRs and overall PCBs. It supports the basis to further study the recycling methods of such critical metal from waste electronics.
author2 Alex Yan Qingyu
author_facet Alex Yan Qingyu
Li, Wen Jie
format Final Year Project
author Li, Wen Jie
author_sort Li, Wen Jie
title Critical metal identification from waste electronics
title_short Critical metal identification from waste electronics
title_full Critical metal identification from waste electronics
title_fullStr Critical metal identification from waste electronics
title_full_unstemmed Critical metal identification from waste electronics
title_sort critical metal identification from waste electronics
publisher Nanyang Technological University
publishDate 2023
url https://hdl.handle.net/10356/171821
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