Deep learning for defect detection

• Main Author: Low, Edwin Xuan Hao
• Other Authors: Qian Kemao
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2023
• Subjects: Engineering::Computer science and engineering::Computing methodologies::Artificial intelligence
• Online Access: https://hdl.handle.net/10356/171974
• Institution: Nanyang Technological University

The increase in demand for technology because of mankind’s reliance on it has led to an increase in manufacturing output for Integrated Chips. Quality assurance of Integrated Chips cannot be understated as it directly affects the operability of the many devices we rely on. Although measures have bee...