GRACER: graph-based standard cell recognition in IC images for hardware assurance

• Main Authors: Huang, Erdong, Hong, Xuenong, Lin, Tong, Shi, Yiqiong, Gwee, Bah Hwee
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2024
• Subjects: Engineering; Hardware assurance; Netlist analysis
• Online Access: https://hdl.handle.net/10356/173733
• Institution: Nanyang Technological University

Global distribution of the Integrated Circuit (IC) supply chain amplifies the importance of Hardware Assurance (HA), i.e., to ensure the integrity of manufactured IC. Standard cell recognition is a crucial step in HA, which is to identify the functionality of a standard cell based on its Scanning El...