Zaw, H. T., & Jianmin, Z. (2024). Machine learning based image analysis for surface defect detection. Nanyang Technological University.
استشهاد بنمط شيكاغوZaw, Htet Thiri, و Zheng Jianmin. Machine Learning Based Image Analysis for Surface Defect Detection. Nanyang Technological University, 2024.
MLA استشهادZaw, Htet Thiri, و Zheng Jianmin. Machine Learning Based Image Analysis for Surface Defect Detection. Nanyang Technological University, 2024.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.