Machine learning based image analysis for surface defect detection

• 主要作者: Htet Thiri Zaw
• 其他作者: Zheng Jianmin
• 格式: Final Year Project
• 語言: English
• 出版: Nanyang Technological University 2024
• 主題: Computer and Information Science; Engineering; Computer science and engineering; Computer vision; Machine learning; Deep learning; Image analysis; Pattern recognition; Neural network architectures
• 在線閱讀: https://hdl.handle.net/10356/175366
• 機構: Nanyang Technological University

The progressive and intelligent advancement of the manufacturing industry demands precise quality control to ensure product excellence. The surface defects that arise during the manufacturing processes pose significant concern as they can lead to quality issues and compromise production integrity...