Machine learning based image analysis for surface defect detection

• Main Author: Htet Thiri Zaw
• Other Authors: Zheng Jianmin
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2024
• Subjects: Computer and Information Science; Engineering; Computer science and engineering; Computer vision; Machine learning; Deep learning; Image analysis; Pattern recognition; Neural network architectures
• Online Access: https://hdl.handle.net/10356/175366
• Institution: Nanyang Technological University

The progressive and intelligent advancement of the manufacturing industry demands precise quality control to ensure product excellence. The surface defects that arise during the manufacturing processes pose significant concern as they can lead to quality issues and compromise production integrity...