APA引文

Heng, D. E., & Bihan, W. (2024). Anomaly detection for X-ray of PCB & IC images. Nanyang Technological University.

Chicago Style Citation

Heng, Daryl Ew-Jynn, and Wen Bihan. Anomaly Detection for X-ray of PCB & IC Images. Nanyang Technological University, 2024.

MLA引文

Heng, Daryl Ew-Jynn, and Wen Bihan. Anomaly Detection for X-ray of PCB & IC Images. Nanyang Technological University, 2024.

警告：這些引文格式不一定是100％准確.