Anomaly detection for X-ray of PCB & IC images
This project investigates the use of deep learning models for defect detection in printed circuit boards and integrated circuits using YOLOv9. We developed a customized neural network model that take binary mask images and identifies defects in each image. The methodology included converting the dat...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Final Year Project |
| Language: | English |
| Published: |
Nanyang Technological University
2024
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/177102 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Nanyang Technological University |
| Language: | English |