Anomaly detection for X-ray of PCB & IC images

• المؤلف الرئيسي: Heng, Daryl Ew-Jynn
• مؤلفون آخرون: Wen Bihan
• التنسيق: Final Year Project
• اللغة: English
• منشور في: Nanyang Technological University 2024
• الموضوعات: Engineering; PCB defect detection
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/177102

This project investigates the use of deep learning models for defect detection in printed circuit boards and integrated circuits using YOLOv9. We developed a customized neural network model that take binary mask images and identifies defects in each image. The methodology included converting the dat...