Anomaly detection for X-ray of PCB & IC images

• Main Author: Heng, Daryl Ew-Jynn
• Other Authors: Wen Bihan
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2024
• Subjects: Engineering; PCB defect detection
• Online Access: https://hdl.handle.net/10356/177102
• Institution: Nanyang Technological University

This project investigates the use of deep learning models for defect detection in printed circuit boards and integrated circuits using YOLOv9. We developed a customized neural network model that take binary mask images and identifies defects in each image. The methodology included converting the dat...