Uncertainty quantification in SAR induced by ultra-high-field MRI RF coil via high-dimensional model representation

• Main Authors: Wang, Xi, Huang, Shao Ying, Yucel, Abdulkadir C.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2024
• Subjects: Engineering; Generalized polynomial chaos; High-dimensional model representation
• Online Access: https://hdl.handle.net/10356/180588
• Institution: Nanyang Technological University

As magnetic field strength in Magnetic Resonance Imaging (MRI) technology increases, maintaining the specific absorption rate (SAR) within safe limits across human head tissues becomes challenging due to the formation of standing waves at a shortened wavelength. Compounding this challenge is the uncertainty in the dielectric properties of head tissues, which notably affects the SAR induced by the radiofrequency (RF) coils in an ultra-high-field (UHF) MRI system. To this end, this study introduces a computational framework to quantify the impacts of uncertainties in head tissues' dielectric properties on the induced SAR. The framework employs a surrogate model-assisted Monte Carlo (MC) technique, efficiently generating surrogate models of MRI observables (electric fields and SAR) and utilizing them to compute SAR statistics. Particularly, the framework leverages a high-dimensional model representation technique, which constructs the surrogate models of the MRI observables via univariate and bivariate component functions, approximated through generalized polynomial chaos expansions. The numerical results demonstrate the efficiency of the proposed technique, requiring significantly fewer deterministic simulations compared with traditional MC methods and other surrogate model-assisted MC techniques utilizing machine learning algorithms, all while maintaining high accuracy in SAR statistics. Specifically, the proposed framework constructs surrogate models of a local SAR with an average relative error of 0.28% using 289 simulations, outperforming the machine learning-based surrogate modeling techniques considered in this study. Furthermore, the SAR statistics obtained by the proposed framework reveal fluctuations of up to 30% in SAR values within specific head regions. These findings highlight the critical importance of considering dielectric property uncertainties to ensure MRI safety, particularly in 7 T MRI systems.