Atomic-thin WS2 kirigami for bidirectional polarization detection
The assembly and patterning engineering in two-dimensional (2D) materials hold importance for chip-level designs incorporating multifunctional detectors. At present, the patterning and stacking methods of 2D materials inevitably introduce impurity instability and functional limitations. Here, the sp...
Saved in:
Main Authors: | , , , , , , , , , , , , |
---|---|
其他作者: | |
格式: | Article |
語言: | English |
出版: |
2024
|
主題: | |
在線閱讀: | https://hdl.handle.net/10356/180833 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
機構: | Nanyang Technological University |
語言: | English |