Reply to comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays"
Accurately measuring the dielectric properties of anisotropic materials is challenging due to their fragility and small size. This study addressed these issues for vertically aligned carbon nanotubes (VACNTs) by engineering them to delaminate from the substrate, retain orientation and porosity, and...
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sg-ntu-dr.10356-1822752025-01-20T06:35:37Z Reply to comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays" Lum, Lucas Ng, Zhi Kai Jiang, Rong Tao Tan, Chong Wei Teo, Edwin Hang Tong Tay, Beng Kang School of Electrical and Electronic Engineering Engineering Anisotropy Carbon nanotubes Accurately measuring the dielectric properties of anisotropic materials is challenging due to their fragility and small size. This study addressed these issues for vertically aligned carbon nanotubes (VACNTs) by engineering them to delaminate from the substrate, retain orientation and porosity, and grow to millimeter lengths. This approach allowed for effective use of the Nicolson-Ross-Weir (NRW) method without additional techniques. While alternative methods by Susek et al. and Knisely et al. might offer higher accuracy, the proposed method is practicable with commercially available equipment, achieving reliable dielectric measurements. 2025-01-20T06:35:37Z 2025-01-20T06:35:37Z 2024 Journal Article Lum, L., Ng, Z. K., Jiang, R. T., Tan, C. W., Teo, E. H. T. & Tay, B. K. (2024). Reply to comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays". IEEE Transactions On Microwave Theory and Techniques, 72(12), 7087-7087. https://dx.doi.org/10.1109/TMTT.2024.3485246 0018-9480 https://hdl.handle.net/10356/182275 10.1109/TMTT.2024.3485246 2-s2.0-85208550261 12 72 7087 7087 en IEEE Transactions on Microwave Theory and Techniques © 2024 IEEE. All rights reserved. |
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Engineering Anisotropy Carbon nanotubes Lum, Lucas Ng, Zhi Kai Jiang, Rong Tao Tan, Chong Wei Teo, Edwin Hang Tong Tay, Beng Kang Reply to comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays" |
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Accurately measuring the dielectric properties of anisotropic materials is challenging due to their fragility and small size. This study addressed these issues for vertically aligned carbon nanotubes (VACNTs) by engineering them to delaminate from the substrate, retain orientation and porosity, and grow to millimeter lengths. This approach allowed for effective use of the Nicolson-Ross-Weir (NRW) method without additional techniques. While alternative methods by Susek et al. and Knisely et al. might offer higher accuracy, the proposed method is practicable with commercially available equipment, achieving reliable dielectric measurements. |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Lum, Lucas Ng, Zhi Kai Jiang, Rong Tao Tan, Chong Wei Teo, Edwin Hang Tong Tay, Beng Kang |
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Article |
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Lum, Lucas Ng, Zhi Kai Jiang, Rong Tao Tan, Chong Wei Teo, Edwin Hang Tong Tay, Beng Kang |
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Lum, Lucas |
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Reply to comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays" |
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Reply to comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays" |
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Reply to comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays" |
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Reply to comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays" |
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Reply to comments on "Anisotropic Microwave Properties of Vertically Aligned Carbon Nanotube Arrays" |
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reply to comments on "anisotropic microwave properties of vertically aligned carbon nanotube arrays" |
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2025 |
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https://hdl.handle.net/10356/182275 |
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