APA Citation

Li, W., & Ming, T. C. (2009). Realistic modeling of electromigration in today’s ULSI interconnections.

Chicago Style Citation

Li, Wei, and Tan Cher Ming. Realistic Modeling of Electromigration in Today’s ULSI Interconnections. 2009.

MLA Citation

Li, Wei, and Tan Cher Ming. Realistic Modeling of Electromigration in Today’s ULSI Interconnections. 2009.

Warning: These citations may not always be 100% accurate.