Modeling of field emission from a sharp tip
The interaction of the charged particles in a vacuum gap has essentially remained an area that is worth exploring in domains of accelerator physics, sheath physics, high current diodes, microwaves sources, and vacuum microelectronics including nano-electronics. Most of the theoretical developments f...
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| Format: | Final Year Project |
| Language: | English |
| Published: |
2010
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| Online Access: | http://hdl.handle.net/10356/20736 |
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| Institution: | Nanyang Technological University |
| Language: | English |
| Summary: | The interaction of the charged particles in a vacuum gap has essentially remained an area that is worth exploring in domains of accelerator physics, sheath physics, high current diodes, microwaves sources, and vacuum microelectronics including nano-electronics. Most of the theoretical developments focused on one dimensional (1D) classical models and they have extended to simple geometries or shapes.
Recently, two dimensional (2D) models are developed and build upon, and had extended to multi-dimensional models, but they are simple of geometries instead of complex geometries.
In this Final Year Project (FYP) report presents the existing knowledge and understanding the behavior of the field emission in the transition from field emission to space charge limited (SCL) regime using a sharp tip model. In the transition region, the electron particles are emitted due to the field emission and both the trajectories of the emitted electrons are tracked using the classical Newtonian physics. |
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