Automatic parallelisation of sequential programs for scientific and industrial applications
This report contains the study of corner detection and the parallelisation of corner detection algorithms on the Texas Instrument TM332OC80 (commonly know as C80).
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2008
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Online Access: | http://hdl.handle.net/10356/3013 |
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sg-ntu-dr.10356-30132023-03-04T03:23:28Z Automatic parallelisation of sequential programs for scientific and industrial applications Wang, Han School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems This report contains the study of corner detection and the parallelisation of corner detection algorithms on the Texas Instrument TM332OC80 (commonly know as C80). RP 59/93 2008-09-17T09:18:49Z 2008-09-17T09:18:49Z 1999 1999 Research Report http://hdl.handle.net/10356/3013 Nanyang Technological University application/pdf |
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DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems Wang, Han Automatic parallelisation of sequential programs for scientific and industrial applications |
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This report contains the study of corner detection and the parallelisation of corner detection algorithms on the Texas Instrument TM332OC80 (commonly know as C80). |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Wang, Han |
format |
Research Report |
author |
Wang, Han |
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Wang, Han |
title |
Automatic parallelisation of sequential programs for scientific and industrial applications |
title_short |
Automatic parallelisation of sequential programs for scientific and industrial applications |
title_full |
Automatic parallelisation of sequential programs for scientific and industrial applications |
title_fullStr |
Automatic parallelisation of sequential programs for scientific and industrial applications |
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Automatic parallelisation of sequential programs for scientific and industrial applications |
title_sort |
automatic parallelisation of sequential programs for scientific and industrial applications |
publishDate |
2008 |
url |
http://hdl.handle.net/10356/3013 |
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1759856756664565760 |