Dimensionality and prototype reduction techniques for pattern analysis

This thesis investigates two important topics in the statistical pattern recognition field, namely dimensionality reduction for supervised classification and prototype reduction for unsupervised classification. For dimensionality reduction part, we concentrate on the Discriminative Linear Dimensiona...

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Bibliographic Details
Main Author:	Qin, Kai
Other Authors:	Ponnuthurai N. Suganthan
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems DRNTU::Engineering::Computer science and engineering::Computing methodologies::Pattern recognition
Online Access:	https://hdl.handle.net/10356/3153
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Institution:	Nanyang Technological University

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spelling	sg-ntu-dr.10356-31532023-07-04T17:25:41Z Dimensionality and prototype reduction techniques for pattern analysis Qin, Kai Ponnuthurai N. Suganthan School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems DRNTU::Engineering::Computer science and engineering::Computing methodologies::Pattern recognition This thesis investigates two important topics in the statistical pattern recognition field, namely dimensionality reduction for supervised classification and prototype reduction for unsupervised classification. For dimensionality reduction part, we concentrate on the Discriminative Linear Dimensionality Reduction (DLDR) techniques with feature extraction for supervised classification as the major application. For prototype reduction part, we focus on the prototype-based clustering algorithms. DOCTOR OF PHILOSOPHY (EEE) 2008-09-17T09:23:25Z 2008-09-17T09:23:25Z 2007 2007 Thesis Qin, K. (2007). Dimensionality and prototype reduction techniques for pattern analysis. Doctoral thesis, Nanyang Technological University, Singapore. https://hdl.handle.net/10356/3153 10.32657/10356/3153 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems DRNTU::Engineering::Computer science and engineering::Computing methodologies::Pattern recognition
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems DRNTU::Engineering::Computer science and engineering::Computing methodologies::Pattern recognition Qin, Kai Dimensionality and prototype reduction techniques for pattern analysis
description	This thesis investigates two important topics in the statistical pattern recognition field, namely dimensionality reduction for supervised classification and prototype reduction for unsupervised classification. For dimensionality reduction part, we concentrate on the Discriminative Linear Dimensionality Reduction (DLDR) techniques with feature extraction for supervised classification as the major application. For prototype reduction part, we focus on the prototype-based clustering algorithms.
author2	Ponnuthurai N. Suganthan
author_facet	Ponnuthurai N. Suganthan Qin, Kai
format	Theses and Dissertations
author	Qin, Kai
author_sort	Qin, Kai
title	Dimensionality and prototype reduction techniques for pattern analysis
title_short	Dimensionality and prototype reduction techniques for pattern analysis
title_full	Dimensionality and prototype reduction techniques for pattern analysis
title_fullStr	Dimensionality and prototype reduction techniques for pattern analysis
title_full_unstemmed	Dimensionality and prototype reduction techniques for pattern analysis
title_sort	dimensionality and prototype reduction techniques for pattern analysis
publishDate	2008
url	https://hdl.handle.net/10356/3153
_version_	1772827887832924160

Dimensionality and prototype reduction techniques for pattern analysis

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