Electrical properties of lead-free (K0.5Na0.5)NbO3 piezoelectric thin films
Due to rising environmental issues on lead usage in microelectronic material, a promising alternative, sodium potassium niobate (KNN) piezoelectric ceramic has been investigated to replace the market dominant lead zinc titanate (PZT) piezoelectric ceramic. However, persistent problems of KNN show th...
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sg-ntu-dr.10356-361772023-03-04T15:41:00Z Electrical properties of lead-free (K0.5Na0.5)NbO3 piezoelectric thin films Sin, Glen Chin Guan. Yao Kui School of Materials Science and Engineering A*STAR Institute of Material Research and Engineering DRNTU::Engineering Due to rising environmental issues on lead usage in microelectronic material, a promising alternative, sodium potassium niobate (KNN) piezoelectric ceramic has been investigated to replace the market dominant lead zinc titanate (PZT) piezoelectric ceramic. However, persistent problems of KNN show that its electrical properties are still unable to compete with PZT. In this report, various electrical properties of KNN thin films have been studied with different thicknesses, including dielectric, ferroelectric, piezoelectric and leakage current. Results showed that the dielectric and ferroelectric properties were generally improved with increased thickness due to the reduced impact of interface effect. Also, the films annealed at 7000C showed better results than the films annealed at 5800C because of reduced space charges and leakages. On the other hand, piezoelectric property did not show favourable increment with increasing film thickness. A suspect of surface cracks caused by striation may be the determining factor that caused d33 value to decrease with increased film thickness. These findings will be considered for improving surface morphology and property of KNN thin film for the future work. Bachelor of Engineering (Materials Engineering) 2010-04-23T04:07:09Z 2010-04-23T04:07:09Z 2010 2010 Final Year Project (FYP) http://hdl.handle.net/10356/36177 en Nanyang Technological University 43 p. application/pdf |
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DRNTU::Engineering Sin, Glen Chin Guan. Electrical properties of lead-free (K0.5Na0.5)NbO3 piezoelectric thin films |
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Due to rising environmental issues on lead usage in microelectronic material, a promising alternative, sodium potassium niobate (KNN) piezoelectric ceramic has been investigated to replace the market dominant lead zinc titanate (PZT) piezoelectric ceramic. However, persistent problems of KNN show that its electrical properties are still unable to compete with PZT. In this report, various electrical properties of KNN thin films have been studied with different thicknesses, including dielectric, ferroelectric, piezoelectric and leakage current. Results showed that the dielectric and ferroelectric properties were generally improved with increased thickness due to the reduced impact of interface effect. Also, the films annealed at 7000C showed better results than the films annealed at 5800C because of reduced space charges and leakages. On the other hand, piezoelectric property did not show favourable increment with increasing film thickness. A suspect of surface cracks caused by striation may be the determining factor that caused d33 value to decrease with increased film thickness. These findings will be considered for improving surface morphology and property of KNN thin film for the future work. |
author2 |
Yao Kui |
author_facet |
Yao Kui Sin, Glen Chin Guan. |
format |
Final Year Project |
author |
Sin, Glen Chin Guan. |
author_sort |
Sin, Glen Chin Guan. |
title |
Electrical properties of lead-free (K0.5Na0.5)NbO3 piezoelectric thin films |
title_short |
Electrical properties of lead-free (K0.5Na0.5)NbO3 piezoelectric thin films |
title_full |
Electrical properties of lead-free (K0.5Na0.5)NbO3 piezoelectric thin films |
title_fullStr |
Electrical properties of lead-free (K0.5Na0.5)NbO3 piezoelectric thin films |
title_full_unstemmed |
Electrical properties of lead-free (K0.5Na0.5)NbO3 piezoelectric thin films |
title_sort |
electrical properties of lead-free (k0.5na0.5)nbo3 piezoelectric thin films |
publishDate |
2010 |
url |
http://hdl.handle.net/10356/36177 |
_version_ |
1759855666093096960 |