MOSFET noise modeling for wireless applications

This thesis presents a high-frequency noise model of MOS (Metal Oxide Semiconductor) devices. The high frequency (HF) noise model is based on the equivalent circuit of the MOS device, but it takes into account both the gate resistance distribution and hot carrier effect.

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書目詳細資料
主要作者: Chen, Xuezhong.
其他作者: Yeo, Kiat Seng
格式: Theses and Dissertations
出版: 2008
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在線閱讀:http://hdl.handle.net/10356/3904
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