Yuan, K., & Radhakrishnan, K. (2008). Growth and characterization of metamorphic layer structures for high electron mobility transistors.
استشهاد بنمط شيكاغوYuan, Kaihua., و K. Radhakrishnan. Growth and Characterization of Metamorphic Layer Structures for High Electron Mobility Transistors. 2008.
MLA استشهادYuan, Kaihua., و K. Radhakrishnan. Growth and Characterization of Metamorphic Layer Structures for High Electron Mobility Transistors. 2008.
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