APA Citation

Yuan, K., & Radhakrishnan, K. (2008). Growth and characterization of metamorphic layer structures for high electron mobility transistors.

Chicago Style Citation

Yuan, Kaihua., and K. Radhakrishnan. Growth and Characterization of Metamorphic Layer Structures for High Electron Mobility Transistors. 2008.

MLA Citation

Yuan, Kaihua., and K. Radhakrishnan. Growth and Characterization of Metamorphic Layer Structures for High Electron Mobility Transistors. 2008.

Warning: These citations may not always be 100% accurate.