Far field prediction of radiated emission from pcb using near-field measurement

This report presents a new near field to far field transformation by using a statistical model approach that has yet to be introduced in the EMC community. The report begins with the introduction of near field to far field transformation which includes the background, motivation, objectives and scop...

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Main Author: Loo, Shin Yi.
Other Authors: See Kye Yak
Format: Final Year Project
Language:English
Published: 2010
Subjects:
Online Access:http://hdl.handle.net/10356/40583
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-405832023-07-07T16:37:45Z Far field prediction of radiated emission from pcb using near-field measurement Loo, Shin Yi. See Kye Yak School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Antennas, wave guides, microwaves, radar, radio This report presents a new near field to far field transformation by using a statistical model approach that has yet to be introduced in the EMC community. The report begins with the introduction of near field to far field transformation which includes the background, motivation, objectives and scope of the project. Next, it will provide theoretical background on the EMC topics and the relationship between near field and far field. The advantages of near field to far field transformation approach are numerous and the transformation has received considerable attention and vast interest from the EMC community over the last few years. A few different approaches will thus be presented in the literature review in chapter two. The main body of the report discusses in detail the methodology of computing far field prediction using two different types of averaging methods. The mathematical principles and reasons behind each averaging method were explained in chapter three and the transformation results will be presented in chapter four, where predicted and actual measure far fields were compared and analyzed in depth. Lastly, the report will end with a conclusion to explain each averaging method and decide on the final approach used and recommendation for future work. Bachelor of Engineering 2010-06-16T08:53:56Z 2010-06-16T08:53:56Z 2010 2010 Final Year Project (FYP) http://hdl.handle.net/10356/40583 en Nanyang Technological University 71 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering::Antennas, wave guides, microwaves, radar, radio
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Antennas, wave guides, microwaves, radar, radio
Loo, Shin Yi.
Far field prediction of radiated emission from pcb using near-field measurement
description This report presents a new near field to far field transformation by using a statistical model approach that has yet to be introduced in the EMC community. The report begins with the introduction of near field to far field transformation which includes the background, motivation, objectives and scope of the project. Next, it will provide theoretical background on the EMC topics and the relationship between near field and far field. The advantages of near field to far field transformation approach are numerous and the transformation has received considerable attention and vast interest from the EMC community over the last few years. A few different approaches will thus be presented in the literature review in chapter two. The main body of the report discusses in detail the methodology of computing far field prediction using two different types of averaging methods. The mathematical principles and reasons behind each averaging method were explained in chapter three and the transformation results will be presented in chapter four, where predicted and actual measure far fields were compared and analyzed in depth. Lastly, the report will end with a conclusion to explain each averaging method and decide on the final approach used and recommendation for future work.
author2 See Kye Yak
author_facet See Kye Yak
Loo, Shin Yi.
format Final Year Project
author Loo, Shin Yi.
author_sort Loo, Shin Yi.
title Far field prediction of radiated emission from pcb using near-field measurement
title_short Far field prediction of radiated emission from pcb using near-field measurement
title_full Far field prediction of radiated emission from pcb using near-field measurement
title_fullStr Far field prediction of radiated emission from pcb using near-field measurement
title_full_unstemmed Far field prediction of radiated emission from pcb using near-field measurement
title_sort far field prediction of radiated emission from pcb using near-field measurement
publishDate 2010
url http://hdl.handle.net/10356/40583
_version_ 1772827075411968000