Far field prediction of radiated emission from pcb using near-field measurement

This report presents a new near field to far field transformation by using a statistical model approach that has yet to be introduced in the EMC community. The report begins with the introduction of near field to far field transformation which includes the background, motivation, objectives and scop...

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書目詳細資料
主要作者: Loo, Shin Yi.
其他作者: See Kye Yak
格式: Final Year Project
語言:English
出版: 2010
主題:
在線閱讀:http://hdl.handle.net/10356/40583
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機構: Nanyang Technological University
語言: English