Design of drop test machine capable of testing electronics up to 20000 g's-1

• 主要作者: Sumitro, Melita.
• 其他作者: Nader Vahdati
• 格式: Final Year Project
• 語言: English
• 出版: 2010
• 主題: DRNTU::Engineering::Mechanical engineering::Machine design and construction
• 在線閱讀: http://hdl.handle.net/10356/40668

Shock test machine has been used for years to test electronic equipments of various devices. The importance of shock test machine increases as more instruments were invented to work in a harsh environment such as military and aeronautical instruments. A shock testing is required to test the...