Fabrication and characterization of nano-scale metamaterials

The main aim of this project is to fabricate nano-scale metal and dielectric material and measure their optical parameters and dispersion relations. Thus, the author may focus on the fabrication of Ag/Au thin film of different thickness and measuring their optical constants as well. Other than that,...

Full description

Saved in:
Bibliographic Details
Main Author: Lin, Yue Hong.
Other Authors: Zhang Dao Hua
Format: Final Year Project
Language:English
Published: 2010
Subjects:
Online Access:http://hdl.handle.net/10356/40684
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-40684
record_format dspace
spelling sg-ntu-dr.10356-406842023-07-07T17:02:39Z Fabrication and characterization of nano-scale metamaterials Lin, Yue Hong. Zhang Dao Hua School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics The main aim of this project is to fabricate nano-scale metal and dielectric material and measure their optical parameters and dispersion relations. Thus, the author may focus on the fabrication of Ag/Au thin film of different thickness and measuring their optical constants as well. Other than that, the simulation of hyperlens with different filling ratio and different thickness of period will be conducted by using the software called COMSOL, hence, the author will investigate any possibilities of improving the performance of hyperlens in terms of changes of filling ratio and thickness of the period. Sputter machine, telemark deposition controller will be used to measure the film thickness and deposition rate, other than that, which may be also used to improve the surface morphology of the thin film by using different temperature, gas flow rate, stage rotation speed, pressure and so on, since the flatness and smoothness of the surface of the thin film is the important key point to improve the performance of the fabricated devices. Additionally, the measurement of the optical parameters of the well fabricated thin film should be done by using ellipsometer. Since the optical properties of the thin film changes with frequency, film thickness and temperature, therefore, measurement of the optical data is very important for both the design and fabrication of nano-optical devices. Bachelor of Engineering 2010-06-18T01:42:00Z 2010-06-18T01:42:00Z 2010 2010 Final Year Project (FYP) http://hdl.handle.net/10356/40684 en Nanyang Technological University 54 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Lin, Yue Hong.
Fabrication and characterization of nano-scale metamaterials
description The main aim of this project is to fabricate nano-scale metal and dielectric material and measure their optical parameters and dispersion relations. Thus, the author may focus on the fabrication of Ag/Au thin film of different thickness and measuring their optical constants as well. Other than that, the simulation of hyperlens with different filling ratio and different thickness of period will be conducted by using the software called COMSOL, hence, the author will investigate any possibilities of improving the performance of hyperlens in terms of changes of filling ratio and thickness of the period. Sputter machine, telemark deposition controller will be used to measure the film thickness and deposition rate, other than that, which may be also used to improve the surface morphology of the thin film by using different temperature, gas flow rate, stage rotation speed, pressure and so on, since the flatness and smoothness of the surface of the thin film is the important key point to improve the performance of the fabricated devices. Additionally, the measurement of the optical parameters of the well fabricated thin film should be done by using ellipsometer. Since the optical properties of the thin film changes with frequency, film thickness and temperature, therefore, measurement of the optical data is very important for both the design and fabrication of nano-optical devices.
author2 Zhang Dao Hua
author_facet Zhang Dao Hua
Lin, Yue Hong.
format Final Year Project
author Lin, Yue Hong.
author_sort Lin, Yue Hong.
title Fabrication and characterization of nano-scale metamaterials
title_short Fabrication and characterization of nano-scale metamaterials
title_full Fabrication and characterization of nano-scale metamaterials
title_fullStr Fabrication and characterization of nano-scale metamaterials
title_full_unstemmed Fabrication and characterization of nano-scale metamaterials
title_sort fabrication and characterization of nano-scale metamaterials
publishDate 2010
url http://hdl.handle.net/10356/40684
_version_ 1772825457814667264