Properties of thin metal films
This project is to develop meta-materials for visible frequencies and explore their application in high resolution/magnification imaging, enhancement of photonic device and cloaking. The COMSOL Multiphysics 3.5 programme is use for designing the various filling ratio and period of metal + dielectric...
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sg-ntu-dr.10356-407202023-07-07T17:09:59Z Properties of thin metal films Lee, Meng Teck. Zhang Dao Hua School of Electrical and Electronic Engineering DRNTU::Engineering This project is to develop meta-materials for visible frequencies and explore their application in high resolution/magnification imaging, enhancement of photonic device and cloaking. The COMSOL Multiphysics 3.5 programme is use for designing the various filling ratio and period of metal + dielectric of meta-materials. Using this programme, Power Flow and FWHM values can extract from various designs. The chosen value of Power Flow and FWHM will be useful for fabricating nano-scale metal and dielectric materials using sputtering machine. Lastly, ellipsometer is also use to investigate the dielectric properties of thin films in comparison with the simulation result using COMSOL programme. Bachelor of Engineering 2010-06-18T06:25:05Z 2010-06-18T06:25:05Z 2010 2010 Final Year Project (FYP) http://hdl.handle.net/10356/40720 en Nanyang Technological University 79 p. application/pdf |
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DRNTU::Engineering Lee, Meng Teck. Properties of thin metal films |
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This project is to develop meta-materials for visible frequencies and explore their application in high resolution/magnification imaging, enhancement of photonic device and cloaking. The COMSOL Multiphysics 3.5 programme is use for designing the various filling ratio and period of metal + dielectric of meta-materials. Using this programme, Power Flow and FWHM values can extract from various designs. The chosen value of Power Flow and FWHM will be useful for fabricating nano-scale metal and dielectric materials using sputtering machine. Lastly, ellipsometer is also use to investigate the dielectric properties of thin films in comparison with the simulation result using COMSOL programme. |
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Zhang Dao Hua |
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Zhang Dao Hua Lee, Meng Teck. |
format |
Final Year Project |
author |
Lee, Meng Teck. |
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Lee, Meng Teck. |
title |
Properties of thin metal films |
title_short |
Properties of thin metal films |
title_full |
Properties of thin metal films |
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Properties of thin metal films |
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Properties of thin metal films |
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properties of thin metal films |
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2010 |
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http://hdl.handle.net/10356/40720 |
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1772828913093836800 |