Residual stress in thin film
The objective of this report is to observe the trend of residual stress with respect to (i) Substrate Bias applied during pre-deposition substrate treatment and (ii) film thickness of (Ti,Al)(N,C) coating material on High-Speed Steel (HSS) substrate. The parameters varied from (i) 0-300W and (ii) 0....
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Main Author: | Hoon, Esther Li Wen. |
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Other Authors: | School of Materials Science and Engineering |
Format: | Final Year Project |
Language: | English |
Published: |
2011
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Subjects: | |
Online Access: | http://hdl.handle.net/10356/44486 |
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Institution: | Nanyang Technological University |
Language: | English |
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