High frequency characterization & analysis of advanced Si MOSFETS
This report compiled all the work that had been done by the author during her Final Year Project subject to fulfill the course requirement under School of Electrical and Electronic Engineering (EEE), Nanyang Technological University.
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| Format: | Final Year Project |
| Language: | English |
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2011
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| Online Access: | http://hdl.handle.net/10356/46397 |
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sg-ntu-dr.10356-463972023-07-07T17:27:39Z High frequency characterization & analysis of advanced Si MOSFETS Ng, Jing Ting. Wang Hong School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Semiconductors This report compiled all the work that had been done by the author during her Final Year Project subject to fulfill the course requirement under School of Electrical and Electronic Engineering (EEE), Nanyang Technological University. Bachelor of Engineering 2011-12-05T08:26:03Z 2011-12-05T08:26:03Z 2011 2011 Final Year Project (FYP) http://hdl.handle.net/10356/46397 en Nanyang Technological University 85 p. application/pdf |
| institution |
Nanyang Technological University |
| building |
NTU Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NTU Library |
| collection |
DR-NTU |
| language |
English |
| topic |
DRNTU::Engineering::Electrical and electronic engineering::Semiconductors |
| spellingShingle |
DRNTU::Engineering::Electrical and electronic engineering::Semiconductors Ng, Jing Ting. High frequency characterization & analysis of advanced Si MOSFETS |
| description |
This report compiled all the work that had been done by the author during her Final Year Project subject to fulfill the course requirement under School of Electrical and Electronic Engineering (EEE), Nanyang Technological University. |
| author2 |
Wang Hong |
| author_facet |
Wang Hong Ng, Jing Ting. |
| format |
Final Year Project |
| author |
Ng, Jing Ting. |
| author_sort |
Ng, Jing Ting. |
| title |
High frequency characterization & analysis of advanced Si MOSFETS |
| title_short |
High frequency characterization & analysis of advanced Si MOSFETS |
| title_full |
High frequency characterization & analysis of advanced Si MOSFETS |
| title_fullStr |
High frequency characterization & analysis of advanced Si MOSFETS |
| title_full_unstemmed |
High frequency characterization & analysis of advanced Si MOSFETS |
| title_sort |
high frequency characterization & analysis of advanced si mosfets |
| publishDate |
2011 |
| url |
http://hdl.handle.net/10356/46397 |
| _version_ |
1772825347387031552 |