Solar cell carrier lifetimemeasurement

This final year project mainly focus on both investigating and developing the capabilities of infrared camera-based characterization techniques feasible for measuring the carrier lifetime of crystalline silicon solar cell material. First of all, the infrared lifetime mapping (ILM) technique is inves...

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Main Author: Li, Kun Peng.
Other Authors: Sun Xiaowei
Format: Final Year Project
Language:English
Published: 2011
Subjects:
Online Access:http://hdl.handle.net/10356/46548
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-465482023-07-07T16:32:16Z Solar cell carrier lifetimemeasurement Li, Kun Peng. Sun Xiaowei School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering This final year project mainly focus on both investigating and developing the capabilities of infrared camera-based characterization techniques feasible for measuring the carrier lifetime of crystalline silicon solar cell material. First of all, the infrared lifetime mapping (ILM) technique is investigated, which was introduced as a fast and contact-free carrier lifetime imaging technique in the year 2000. It is based on the principle of absorption of infrared radiation by free carriers. The physical principles and necessary calibration procedures are discussed, the ILM provides the actual local lifetime at low-level injection, whereas many standard lifetime measurement techniques (e.g. MW-PCD) yield differential lifetimes only. Secondly, by using the infrared camera to measure the carrier lifetime of silicon solar cell, it significantly reduces the measurement times from hours to minutes or even seconds, where the laterally resolved information can be obtained without scanning the sample. In order to capture meaningful results on materials used in production environment, the use of blackbody and a suitable illumination source is critical. Thirdly, the quantitative comparison with other existing lifetime measurement approaches and applications to silicon samples at different process stages will be discussed. Finally, methods for further reducing the time of measurement with a greater degree are discussed, which may well be suitable for in-line process control in the sense of future implementation. Bachelor of Engineering 2011-12-21T02:38:55Z 2011-12-21T02:38:55Z 2011 2011 Final Year Project (FYP) http://hdl.handle.net/10356/46548 en Nanyang Technological University 57 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Li, Kun Peng.
Solar cell carrier lifetimemeasurement
description This final year project mainly focus on both investigating and developing the capabilities of infrared camera-based characterization techniques feasible for measuring the carrier lifetime of crystalline silicon solar cell material. First of all, the infrared lifetime mapping (ILM) technique is investigated, which was introduced as a fast and contact-free carrier lifetime imaging technique in the year 2000. It is based on the principle of absorption of infrared radiation by free carriers. The physical principles and necessary calibration procedures are discussed, the ILM provides the actual local lifetime at low-level injection, whereas many standard lifetime measurement techniques (e.g. MW-PCD) yield differential lifetimes only. Secondly, by using the infrared camera to measure the carrier lifetime of silicon solar cell, it significantly reduces the measurement times from hours to minutes or even seconds, where the laterally resolved information can be obtained without scanning the sample. In order to capture meaningful results on materials used in production environment, the use of blackbody and a suitable illumination source is critical. Thirdly, the quantitative comparison with other existing lifetime measurement approaches and applications to silicon samples at different process stages will be discussed. Finally, methods for further reducing the time of measurement with a greater degree are discussed, which may well be suitable for in-line process control in the sense of future implementation.
author2 Sun Xiaowei
author_facet Sun Xiaowei
Li, Kun Peng.
format Final Year Project
author Li, Kun Peng.
author_sort Li, Kun Peng.
title Solar cell carrier lifetimemeasurement
title_short Solar cell carrier lifetimemeasurement
title_full Solar cell carrier lifetimemeasurement
title_fullStr Solar cell carrier lifetimemeasurement
title_full_unstemmed Solar cell carrier lifetimemeasurement
title_sort solar cell carrier lifetimemeasurement
publishDate 2011
url http://hdl.handle.net/10356/46548
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