Enhancement of reliability data analysis software

Reliability tests are now a common place for semiconductor industry; however, the analysis of the data is far from accurate. Software has been developed to meet the need of the industry. In this project, enhancement of the software will be made in the use of various physics-based models for the extr...

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Bibliographic Details
Main Author:	Nay Lin Aung
Other Authors:	Tan, Cher Ming
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
Online Access:	http://hdl.handle.net/10356/4929
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-4929
record_format	dspace
spelling	sg-ntu-dr.10356-49292023-07-04T15:19:09Z Enhancement of reliability data analysis software Nay Lin Aung Tan, Cher Ming School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems Reliability tests are now a common place for semiconductor industry; however, the analysis of the data is far from accurate. Software has been developed to meet the need of the industry. In this project, enhancement of the software will be made in the use of various physics-based models for the extrapolation of accelerated test data to the normal operation conditions. Master of Science (Microelectronics) 2008-09-17T10:01:40Z 2008-09-17T10:01:40Z 2002 2002 Thesis http://hdl.handle.net/10356/4929 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Computer hardware, software and systems Nay Lin Aung Enhancement of reliability data analysis software
description	Reliability tests are now a common place for semiconductor industry; however, the analysis of the data is far from accurate. Software has been developed to meet the need of the industry. In this project, enhancement of the software will be made in the use of various physics-based models for the extrapolation of accelerated test data to the normal operation conditions.
author2	Tan, Cher Ming
author_facet	Tan, Cher Ming Nay Lin Aung
format	Theses and Dissertations
author	Nay Lin Aung
author_sort	Nay Lin Aung
title	Enhancement of reliability data analysis software
title_short	Enhancement of reliability data analysis software
title_full	Enhancement of reliability data analysis software
title_fullStr	Enhancement of reliability data analysis software
title_full_unstemmed	Enhancement of reliability data analysis software
title_sort	enhancement of reliability data analysis software
publishDate	2008
url	http://hdl.handle.net/10356/4929
_version_	1772826344730656768

Enhancement of reliability data analysis software

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