Characterization of thin dielectric films containing nanocrystals or nanoparticles

In this project, the optical properties of NiO thin film, which is embedded with nanocrystals Ni, is investigated. Three Ni-rich NiO thin film samples which are synthesized by different sputtering power and duration are granted to this project. The Spectroscopic Ellipsometry (SE) was employed to obt...

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Bibliographic Details
Main Author: Yap, Poh Ling.
Other Authors: Chen Tupei
Format: Final Year Project
Language:English
Published: 2012
Subjects:
Online Access:http://hdl.handle.net/10356/49427
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Institution: Nanyang Technological University
Language: English
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