Chen, Y., & Goh Kuan Eng, J. (2012). Study of degradation mechanism of metal nanocrystal-based gate stacks.
استشهاد بنمط شيكاغوChen, Yining, و Johnson Goh Kuan Eng. Study of Degradation Mechanism of Metal Nanocrystal-based Gate Stacks. 2012.
MLA استشهادChen, Yining, و Johnson Goh Kuan Eng. Study of Degradation Mechanism of Metal Nanocrystal-based Gate Stacks. 2012.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.