Chen, Y., & Goh Kuan Eng, J. (2012). Study of degradation mechanism of metal nanocrystal-based gate stacks.
Chicago Style CitationChen, Yining, and Johnson Goh Kuan Eng. Study of Degradation Mechanism of Metal Nanocrystal-based Gate Stacks. 2012.
MLA引文Chen, Yining, and Johnson Goh Kuan Eng. Study of Degradation Mechanism of Metal Nanocrystal-based Gate Stacks. 2012.
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