發送短信 : Electromigration behaviour of copper metal lines in ULSI devices

 _____       ___     ______     ______    ______  
|  __ \\    / _ \\  |      \\  /_   _//  /_____// 
| |  \ ||  / //\ \\ |  --  //   -| ||-   `____ `  
| |__/ || |  ___  |||  --  \\   _| ||_   /___//   
|_____//  |_||  |_|||______//  /_____//  `__ `    
 -----`   `-`   `-` `------`   `-----`   /_//     
                                         `-`