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  ______   _    _    ______     ______   __   __  
 /_   _// | || | || |      \\  /_   _//  \ \\/ // 
 `-| |,-  | || | || |  --  //   -| ||-    \   //  
   | ||   | \\_/ || |  --  \\   _| ||_    / . \\  
   |_||    \____//  |______//  /_____//  /_//\_\\ 
   `-`'     `---`   `------`   `-----`   `-`  --`

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發送短信 : Electromigration behaviour of copper metal lines in ULSI devices