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 _    _     _____    _    _    _    _    __   _   
| \  / ||  |  ___|| | || | || | || | || | || | || 
|  \/  ||  | ||__   | || | || | || | || | '--' || 
| .  . ||  | ||__   | \\_/ || | \\_/ || | .--. || 
|_|\/|_||  |_____||  \____//   \____//  |_|| |_|| 
`-`  `-`   `-----`    `---`     `---`   `-`  `-`

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Text this: Electromigration behaviour of copper metal lines in ULSI devices