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  _____      ___    __    __   __   __            
 /  ___||   / _ \\  \ \\ / //  \ \\/ //   ____    
| // __    | / \ ||  \ \/ //    \ ` //   |    \\  
| \\_\ ||  | \_/ ||   \  //      | ||    | [] ||  
 \____//    \___//     \//       |_||    |  __//  
  `---`     `---`       `        `-`'    |_|`-`   
                                         `-`

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Text this: Electromigration behaviour of copper metal lines in ULSI devices