Characterisation of electrical properties of dielectric materials

• Main Author: Wu, Xing.
• Other Authors: Chen Tupei
• Format: Final Year Project
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering
• Online Access: http://hdl.handle.net/10356/53251
• Institution: Nanyang Technological University

In this report, the Final Year Project on material characterization using microwave methods are summarized. The relative permittivity measurement using open ended coaxial probe method has been investigated both theoretically and experimentally. A capacitive mathematical model is used to determine the relative permittivity from the collected reflection coefficient under different measurement scenarios(different types apples, different operation frequencies and with/without apple skin). The measurements results given by capacitive model are observed to be well-matched with the estimated relative permittivity obtain by a commercial software. Moreover, this project has also focused on the influences of different skins, types, cutting depths of apples. Last but not least, a dielectric property measurement software has been developed to evaluate the relative permittivity directly.