Development of data acquisition system to compute metal electron work function

• Main Author: Leow, Sze Min.
• Other Authors: Tan Cher Ming
• Format: Final Year Project
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering
• Online Access: http://hdl.handle.net/10356/53347
• Institution: Nanyang Technological University

Scanning Kelvin Probe (SKP) microscopy is a technique commonly used to achieve the contact potential difference (CPD) between two surfaces – the sample and the probe. During measurements, a SKP was used to get the voltage and current values of a sample from its work station. In this project, a Graph...