Nanoscale measurement by using the near-field polarization

• Main Author: Liu, Zhuang.
• Other Authors: Soh Yeng Chai
• Format: Theses and Dissertations
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering
• Online Access: http://hdl.handle.net/10356/53737
• Institution: Nanyang Technological University

This thesis studies the polarization representations of near-field light for 3D nano-scale measurement and resolution improvement of SNOM imaging. The work is performed from two aspects. One aspect is to achieve optical measurements and thin film characterizations by using polarization-based SNOM. T...