ITouch variable light source for reflection NDT

Non Destructive Testing (NDT) has been increasingly prominent in many industries of today as the requirements of quality control and demand for quality products has become increasingly important to end-users. While there are many ways to conduct NDT, non-contact based methods such as the use of opti...

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Bibliographic Details
Main Author: Wong, Jun Xian.
Other Authors: Anand Krishna Asundi
Format: Final Year Project
Language:English
Published: 2013
Subjects:
Online Access:http://hdl.handle.net/10356/54091
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Institution: Nanyang Technological University
Language: English
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Summary:Non Destructive Testing (NDT) has been increasingly prominent in many industries of today as the requirements of quality control and demand for quality products has become increasingly important to end-users. While there are many ways to conduct NDT, non-contact based methods such as the use of optical or laser instruments, has attracted an increased interest in recent developments. At the same time, three-dimension profiling has also been in the spotlight of recent developments. The ability of fringe projection to accomplish such requirements is growing rapidly, as such, fringe reflection technique has become an increasingly effective tool for three-dimensional measurement of specular, reflecting surfaces. Fringe reflection technique makes use of gradient of slopes on surface features to reconstruct the surface shape.Currently, most of the systems that makes use of fringe reflection technique, are built to handle measurements of middle to large sized objects. For example, the quality control of automobile painted surfaces makes use of fringe reflection technique, using large size displays to project the fringe patterns. However, there is a lack of developments of fringe reflection systems employed for smaller sized objects that would require higher measuring resolution.The development of a compact fringe reflection system will be explored and experimented on to find a feasible solution to accomplish the task of small size object specular surface measurements.