Artefact removal for neonatal electroencephalogram

• Main Author: Hou, Yuan.
• Other Authors: Pina Marziliano
• Format: Final Year Project
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering
• Online Access: http://hdl.handle.net/10356/54471
• Institution: Nanyang Technological University

Neonatal electroencephalogram (EEG) provides vital diagnostic/prognostic insight. Apartnfrom vigilant state (e.g. induced by seizure, Central Nervous System diseases etc.) detection, it is also the cornerstone in Sleep-Wake-Cycle (SWC) recognition. SWC recognition holds great clinical significance a...