Transition metal oxide based resistive RAM for high density non-vilatile memory

Nonvolatile memory technology (NVM) is one of the key driving factors for information storage development. With memory technology aggressively migrating into the sub-10 nm nano-scale regime, the traditional nonvolatile FLASH memory is facing challenging issues such as lithography, coupling ratio, cr...

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主要作者: Tran, Xuan Anh
其他作者: Yu Hong Yu
格式: Theses and Dissertations
語言:English
出版: 2013
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在線閱讀:https://hdl.handle.net/10356/54826
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機構: Nanyang Technological University
語言: English