System identification for RTPCVD process

Semiconductor manufacturing industry is pursuing a higher degree of automation recently. However, currently the supervisory control of nitride process is based on experts' experiences and manual works. Although there are multiple control schemes that can be implemented to the process, due to th...

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Bibliographic Details
Main Author: Yu, Feng.
Other Authors: Wang Dan Wei
Format: Theses and Dissertations
Language:English
Published: 2014
Subjects:
Online Access:http://hdl.handle.net/10356/55252
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Institution: Nanyang Technological University
Language: English