Optical characterization of conductive metal oxide thin films

Thickness dependent and growth temperature dependent ZnO thin film optical properties (complex dielectric function, band gap energy and exciton binding energy) have been studied by using spectroscopic ellipsometry (SE) based on Yoshikawa and Adachi’s model. Comparing with bulk ZnO material, ZnO thin...

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書目詳細資料
主要作者: Pan, Ruoping
其他作者: Chen Tupei
格式: Final Year Project
語言:English
出版: 2014
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在線閱讀:http://hdl.handle.net/10356/60431
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