Defect reduction and control based on application of process control
This thesis addresses the defect reduction and control in a printing process at a food packaging company now experiencing hundreds of printing defects. Methodologies of Define, Measure, Analyze, Improve, and Control (DMAIC), and Response Surface Model were introduced to reduce the defect rate and co...
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sg-ntu-dr.10356-606122020-11-01T11:32:21Z Defect reduction and control based on application of process control Dai, Qi Yue Chee Yoon School of Mechanical and Aerospace Engineering Singapore-MIT Alliance Programme DRNTU::Engineering::Manufacturing This thesis addresses the defect reduction and control in a printing process at a food packaging company now experiencing hundreds of printing defects. Methodologies of Define, Measure, Analyze, Improve, and Control (DMAIC), and Response Surface Model were introduced to reduce the defect rate and control the process. As a result, critical inputs were identified, and a set of statistical regression models were constructed to predict the flaw size and its variance by knowing the critical inputs of the process. The mathematical optimal settings were determined to minimize the flaw size and its variance. Moreover, advanced control charts, and detailed Out-of-Control-Action-Plans (OCAP) were developed to monitor and control the process. Master of Science (IMST) 2014-05-29T02:38:54Z 2014-05-29T02:38:54Z 2010 2010 Thesis http://hdl.handle.net/10356/60612 en 58 p. application/pdf |
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DRNTU::Engineering::Manufacturing Dai, Qi Defect reduction and control based on application of process control |
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This thesis addresses the defect reduction and control in a printing process at a food packaging company now experiencing hundreds of printing defects. Methodologies of Define, Measure, Analyze, Improve, and Control (DMAIC), and Response Surface Model were introduced to reduce the defect rate and control the process. As a result, critical inputs were identified, and a set of statistical regression models were constructed to predict the flaw size and its variance by knowing the critical inputs of the process. The mathematical optimal settings were determined to minimize the flaw size and its variance. Moreover, advanced control charts, and detailed Out-of-Control-Action-Plans (OCAP) were developed to monitor and control the process. |
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Yue Chee Yoon |
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Yue Chee Yoon Dai, Qi |
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Theses and Dissertations |
author |
Dai, Qi |
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Dai, Qi |
title |
Defect reduction and control based on application of process control |
title_short |
Defect reduction and control based on application of process control |
title_full |
Defect reduction and control based on application of process control |
title_fullStr |
Defect reduction and control based on application of process control |
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Defect reduction and control based on application of process control |
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defect reduction and control based on application of process control |
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2014 |
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http://hdl.handle.net/10356/60612 |
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