Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system

Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system

The highly competitive nature of the ink jet supplies business has resulted in shorter product life cycles and lower profit margins amidst greater customer expectations. The early identification and resolution of sources of yield loss, especially during the product ramp-up stage, is vital to the con...

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Main Authors: Ashish Maskara, Tajan, John Benedict, Wang, Lisha
Other Authors: Yoon Soon Fatt
Format: Theses and Dissertations
Language:English
Published: 2014
Subjects:
DRNTU::Engineering::Manufacturing
Online Access:http://hdl.handle.net/10356/60617
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Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-60617
record_format dspace
spelling sg-ntu-dr.10356-606172020-11-01T11:38:47Z Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system Ashish Maskara Tajan, John Benedict Wang, Lisha Yoon Soon Fatt School of Electrical and Electronic Engineering Hewlett-Packard (HP) Singapore-MIT Alliance Programme DRNTU::Engineering::Manufacturing The highly competitive nature of the ink jet supplies business has resulted in shorter product life cycles and lower profit margins amidst greater customer expectations. The early identification and resolution of sources of yield loss, especially during the product ramp-up stage, is vital to the continued profitability of the HP wafer fabrication facility in Singapore. Conventional yield analysis methods currently being employed have been deemed inadequate in accelerating the identification of potential sources of yield loss. Unconventional yield analysis methodologies which are accurate and easy to use are required to uncover unknown sources of yield loss. ​Master of Science (IMST) 2014-05-29T02:46:15Z 2014-05-29T02:46:15Z 2004 2004 Thesis http://hdl.handle.net/10356/60617 en 109 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Manufacturing
spellingShingle DRNTU::Engineering::Manufacturing
Ashish Maskara
Tajan, John Benedict
Wang, Lisha
Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system
description The highly competitive nature of the ink jet supplies business has resulted in shorter product life cycles and lower profit margins amidst greater customer expectations. The early identification and resolution of sources of yield loss, especially during the product ramp-up stage, is vital to the continued profitability of the HP wafer fabrication facility in Singapore. Conventional yield analysis methods currently being employed have been deemed inadequate in accelerating the identification of potential sources of yield loss. Unconventional yield analysis methodologies which are accurate and easy to use are required to uncover unknown sources of yield loss.
author2 Yoon Soon Fatt
author_facet Yoon Soon Fatt
Ashish Maskara
Tajan, John Benedict
Wang, Lisha
format Theses and Dissertations
author Ashish Maskara
Tajan, John Benedict
Wang, Lisha
author_sort Ashish Maskara
title Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system
title_short Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system
title_full Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system
title_fullStr Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system
title_full_unstemmed Robust algorithms for identifying sources of yield impact in a reentrant manufacturing system
title_sort robust algorithms for identifying sources of yield impact in a reentrant manufacturing system
publishDate 2014
url http://hdl.handle.net/10356/60617
_version_ 1688665635069886464

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